Wafer Quality Measurement Device VWECER2500 *Catalog available
Measurement can be completed in a short time of about 10 seconds per wafer, shortening the inspection process! Defective cells can be detected at an earlier stage than before, improving product yield.
Good news for manufacturers of solar cell ingots, wafers, and cells. We have a wafer quality measurement device that can measure in about 10 seconds per wafer, significantly shortening the inspection process. ■Solution for Crystal Technology Our silicon wafer quality measurement device for solar cells, equipped with the measurement technology (HS-CMR method) we developed, can accurately measure the quality of silicon wafers for solar cells without turning them into cells. By analyzing the obtained data, it contributes to reducing solar cell manufacturing costs and improving quality. 【Features】 ◆ High correlation with conversion efficiency ◆ Measurement time of about 10 seconds per wafer ◆ Simple device configuration *For more details, please download the catalog or feel free to contact us.
- 企業：パンソリューションテクノロジーズ
- 価格：Other
